|Date de l'événement||14 février 2018|
On February 14th 2018, the ultimate solution for every scientist who seeks absolute analysis and understanding of their samples will be unveiling.
Key learning objectives:
– Learn about a new particle characterization system designed to help you understand your processes and samples
– Explore a new troubleshooting method for use during product development and manufacture
– Create confidence in your process and detect anomalies and contaminants, pinpointing process deviations
– Maximize the information produced during your particle analysis measurements